德***Sentech光伏測量儀器MDPspot，靈活的自動掃描系統(tǒng)

 

具有成本效益的臺式少子壽命測試儀MDPspot可用于表征晶片或面。它為少子壽命測量提供了***個測量點(diǎn)。

 

低成本桌面式壽命測量系統(tǒng)，用于手動操作表征不同制備階段的各種不同硅樣品?？蛇x的手動操作Z軸用于厚度多達(dá)156毫米的樣品。標(biāo)準(zhǔn)軟件可輸出可視化的測量結(jié)果。

 

MDPspot包括附加電阻率測量選項(xiàng)。只測量硅的電阻，對于沒有高度調(diào)節(jié)可能性的晶片，或者對于磚。這兩個選項(xiàng)中的***個必須是預(yù)先定義的。

 

優(yōu)勢

。用于單點(diǎn)測量少子壽命的臺式裝置，可測量多晶或單晶硅在不同制備階段，從成長到后面器件。
。體積小，成本低，使用方便。附帶***個基本軟件，用于在小型電腦或筆記本上輸出可視化的測量結(jié)果。
。適用于晶片上的磚，易于進(jìn)行高度調(diào)整。

MDPspot flexible automatic scanning system

 

The cost - effective desktop low - child - life tester MDPspot can be used to characterize chips or surfaces.It provides a measuring point for measuring the life span of children.

 

Low cost desktop life measurement system for manual characterization of various silicon samples at different preparation stages.The optional manually operated z-axis is used for samples up to 156 mm thick.Standard software can output visual measurement results.

 

 

MDPspot includes additional resistivity measurement options.Only the electrical resistance of silicon is measured, either for wafers with no possibility of high regulation, or for bricks.One of the two options must be predefined.